Cypress Semiconductor CY7C1473BV33 Manual de usuario Pagina 20

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CY7C1471BV33
CY7C1473BV33
Document Number: 001-15029 Rev. *G Page 20 of 31
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ................................ –65C to +150C
Ambient temperature
with power applied ................................... –55C to +125C
Supply voltage on V
DD
relative to GND .......–0.5 V to +4.6 V
Supply voltage on V
DDQ
relative to GND ...... –0.5 V to +V
DD
DC voltage applied to
outputs in tri-state .............................–0.5 V to V
DDQ
+ 0.5 V
DC input voltage ................................. –0.5 V to V
DD
+ 0.5 V
Current into outputs (LOW) ........................................ 20 mA
Static discharge voltage
(MIL-STD-883, Method 3015) ................................. > 2001 V
Latch-up current .................................................... > 200 mA
Operating Range
Range
Ambient
Temperature
V
DD
V
DDQ
Commercial 0 °C to +70 °C 3.3 V– 5% /
+ 10%
2.5 V – 5% to
V
DD
Industrial –40 °C to +85 °C
Electrical Characteristics
Over the Operating Range
Parameter
[15, 16]
Description Test Conditions Min Max Unit
V
DD
Power supply voltage 3.135 3.6 V
V
DDQ
I/O supply voltage For 3.3 V I/O 3.135 V
DD
V
For 2.5 V I/O 2.375 2.625 V
V
OH
Output HIGH voltage For 3.3 V I/O, I
OH
= –4.0 mA 2.4 V
For 2.5 V I/O, I
OH
= –1.0 mA 2.0 V
V
OL
Output LOW voltage For 3.3 V I/O, I
OL
= 8.0 mA 0.4 V
For 2.5 V I/O, I
OL
= 1.0 mA 0.4 V
V
IH
Input HIGH voltage
[15]
For 3.3 V I/O 2.0 V
DD
+ 0.3 V V
For 2.5 V I/O 1.7 V
DD
+ 0.3 V V
V
IL
Input LOW voltage
[15]
For 3.3 V I/O –0.3 0.8 V
For 2.5 V I/O –0.3 0.7 V
I
X
Input leakage current except ZZ
and MODE
GND V
I
V
DDQ
–5 5 A
Input current of MODE Input = V
SS
–30 A
Input = V
DD
–5A
Input current of ZZ Input = V
SS
–5 A
Input = V
DD
30 A
I
OZ
Output leakage current GND V
I
V
DD,
output disabled –5 5 A
I
DD
[17]
V
DD
operating supply current V
DD
= Max., I
OUT
= 0 mA,
f = f
MAX
= 1/t
CYC
7.5 ns cycle,
133 MHz
–305mA
I
SB1
Automatic CE power-down
current – TTL inputs
V
DD
= Max, device deselected,
V
IN
V
IH
or V
IN
V
IL
,
f = f
MAX
, inputs switching
7.5 ns cycle,
133 MHz
–200mA
I
SB2
Automatic CE power-down
current – CMOS inputs
V
DD
= Max, device deselected,
V
IN
0.3 V or V
IN
> V
DD
– 0.3 V,
f = 0, inputs static
7.5 ns cycle,
133 MHz
–120mA
I
SB3
Automatic CE power-down
current – CMOS inputs
V
DD
= Max, device deselected,
V
IN
0.3 V or V
IN
> V
DDQ
– 0.3 V,
f = f
MAX
, inputs switching
7.5 ns cycle,
133 MHz
–200mA
Notes
15. Overshoot: V
IH(AC)
< V
DD
+ 1.5 V (pulse width less than t
CYC
/2). Undershoot: V
IL(AC)
> –2 V (pulse width less than t
CYC
/2).
16. T
Power-up
: assumes a linear ramp from 0 V to V
DD(min.)
within 200 ms. During this time V
IH
< V
DD
and V
DDQ
< V
DD
.
17. The operation current is calculated with 50% read cycle and 50% write cycle.
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