Cypress Semiconductor STK22C48 Manual de usuario Pagina 8

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STK22C48
Document Number: 001-51000 Rev. *E Page 8 of 17
Capacitance
In the following table, the capacitance parameters are listed.
[5]
Parameter Description Test Conditions Max Unit
C
IN
Input capacitance T
A
= 25 C, f = 1 MHz,
V
CC
= 0 to 3.0 V
8pF
C
OUT
Output capacitance 7pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
[5]
Parameter Description Test Conditions
28-SOIC
(300 mil)
28-SOIC
(330 mil)
Unit
JA
Thermal resistance
(junction to ambient)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
TBD TBD C/W
JC
Thermal resistance
(junction to case)
TBD TBD C/W
Figure 6. AC Test Loads
AC Test Conditions
5.0 V
Output
30 pF
R1 963
R2
512
5.0 V
Output
5 pF
R1 963
R2
512
For Tri-state Specs
Input pulse levels....................................................0 V to 3 V
Input rise and fall times (10% to 90%)......................... <
5 ns
Input and output timing reference levels ....................... 1.5 V
Note
5. These parameters are guaranteed by design and are not tested.
Not Recommended for New Designs. In production to support ongoing production programs only.
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